Standard Practice for
Analytically Describing Sputter-Depth-Profile Interface Data
by an Extended Logistic Function1
This standard is issued under the fixed designation E 1636; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
click below Astm E 1636 – 94 (Reapproved 1999) pdf free download